Overney, Frederic: search on Z-Library

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1

Impedance bridges: from Wheatstone to Josephson

Overney, Frédéric, Jeanneret, Blaise

Journal:

Year:

2018

Language:

english

File:

PDF, 9.28 MB

english, 2018

2

[IEEE 2020 Conference on Precision Electromagnetic Measurements (CPEM 2020) - Denver (Aurora), CO, USA (2020.8.24-2020.8.28)] 2020 Conference on Precision Electromagnetic Measurements (CPEM) - Impedance Metrology: Bridging the LF-RF Gap

Agustoni, Marco, Overney, Frederic

Year:

2020

File:

PDF, 1.37 MB

2020

3

[IEEE 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012) - Washington, DC, USA (2012.07.1-2012.07.6)] 2012 Conference on Precision electromagnetic Measurements - Impedance simulator for automatic calibration of LCR meters over the entire complex plan

Overney, Frederic, Jeanneret, Blaise

Year:

2012

Language:

english

File:

PDF, 1.93 MB

english, 2012

4

Comparative study of single and multi domain CVD graphene using large-area Raman mapping and electrical transport characterization

Thodkar, Kishan, El Abbassi, Maria, Lüönd, Felix, Overney, Frédéric, Schönenberger, Christian, Jeanneret, Blaise, Calame, Michel

Journal:

physica status solidi (RRL) - Rapid Research Letters

Year:

2016

Language:

english

File:

PDF, 366 KB

english, 2016

5

Calibration of an LCR-Meter at Arbitrary Phase Angles Using a Fully Automated Impedance Simulator

Overney, Frederic, Jeanneret, Blaise

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2017

Language:

english

File:

PDF, 2.64 MB

english, 2017

6

[IEEE 2014 Conference on Precision Electromagnetic Measurements (CPEM 2014) - Rio de Janeiro, Brazil (2014.8.24-2014.8.29)] 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) - Impedance simulator for automatic calibration of LCR-meters

Overney, Frederic, Jeanneret, Blaise

Year:

2014

Language:

english

File:

PDF, 339 KB

english, 2014

7

[IEEE 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Paris, France (2018.7.8-2018.7.13)] 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Characterization of a Dual Josephson Impedance Bridge

Overney, Frederic, Flowers-Jacobs, Nathan E., Jeanneret, Blaise, Rufenachr, Alain, Fox, Anna E., Dresselhaus, Paul D., Benz, Samuel P.

Year:

2018

Language:

english

File:

PDF, 860 KB

english, 2018

8

[IEEE 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Ottawa, ON, Canada (2016.7.10-2016.7.15)] 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Josephson-based full digital bridge for high-accuracy impedance comparisons

Overney, Frederic, Flowers-Jacobs, Nathan E., Jeanneret, Blaise, Rufenacht, Alain, Fox, Anna E., Underwood, Jason M., Koffman, Andrew D., Benz, Samuel P.

Year:

2016

Language:

english

File:

PDF, 1.75 MB

english, 2016

9

Josephson-based full digital bridge for high-accuracy impedance comparisons

Overney, Frédéric, Flowers-Jacobs, Nathan E, Jeanneret, Blaise, Rüfenacht, Alain, Fox, Anna E, Underwood, Jason M, Koffman, Andrew D, Benz, Samuel P

Journal:

Year:

2016

Language:

english

File:

PDF, 1.04 MB

english, 2016

10

[IEEE 2014 Conference on Precision Electromagnetic Measurements (CPEM 2014) - Rio de Janeiro, Brazil (2014.8.24-2014.8.29)] 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) - Digitally assisted coaxial bridge for automatic quantum Hall effect measurements at audio frequencies

Overney, Frederic, Luond, Felix, Jeanneret, Blaise

Year:

2014

Language:

english

File:

PDF, 287 KB

english, 2014

11

Broadband fully automated digitally assisted coaxial bridge for high accuracy impedance ratio measurements

Overney, Frédéric, Lüönd, Felix, Jeanneret, Blaise

Journal:

Year:

2016

Language:

english

File:

PDF, 1.09 MB

english, 2016

12

[IEEE 2020 Conference on Precision Electromagnetic Measurements (CPEM 2020) - Denver (Aurora), CO, USA (2020.8.24-2020.8.28)] 2020 Conference on Precision Electromagnetic Measurements (CPEM) - Dual Josephson Impedance Bridge: Universal bridge for impedance metrology

Overney, Frederic, Flowers-Jacobs, Nathan E., Jeanneret, Blaise, Rufenacht, Alain, Fox, Anna E., Dresselhaus, Paul D., Benz, Samuel P.

Year:

2020

File:

PDF, 316 KB

2020

13

[IEEE 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Ottawa, ON, Canada (2016.7.10-2016.7.15)] 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Josephson-based characterization of analog-to-digital converters using an equivalent time sampling method

Jeanneret, Blaise, Overney, Frederic, Scherly, Christophe, Schaller, Gerald

Year:

2016

Language:

english

File:

PDF, 882 KB

english, 2016

14

[IEEE 2020 Conference on Precision Electromagnetic Measurements (CPEM 2020) - Denver (Aurora), CO, USA (2020.8.24-2020.8.28)] 2020 Conference on Precision Electromagnetic Measurements (CPEM) - Load Compensation Bridge for Pulse-Driven Josephson Junction Arrays

Jeanneret, Blaise, Overney, Frederic, Pimsut, Yaowaret, Bauer, Stephan, Kieler, Oliver, Behr, Ralf

Year:

2020

File:

PDF, 1.13 MB

2020

15

Thermal stability of Si/Si1 − x − yGexCy/Si heterostructures grown by rapid thermal chemical vapor deposition

Patricia Warren, Jian Mi, Frédéric Overney, Michel Dutoit

Journal:

Journal of Crystal Growth

Year:

1995

Language:

english

File:

PDF, 424 KB

english, 1995

16

[IEEE 2004 Conference on Precision Electromagnetic Measurements - London, UK (2004.06.27-2004.07.2)] 2004 Conference on Precision Electromagnetic Measurements - NRC-METAS-PTB Collaboration, Part 2: Linear Frequency Dependence in AC Resistance Measurement

Schurr, Jurgen, Wood, Barry, Overney, Frederic

Year:

2004

Language:

english

File:

PDF, 370 KB

english, 2004

17

An international comparison of phase angle standards between the novel impedance bridges of CMI, INRIM and METAS

Ortolano, Massimo, Palafox, Luis, Kučera, Jan, Callegaro, Luca, D’Elia, Vincenzo, Marzano, Martina, Overney, Frédéric, Gülmez, Gülay

Journal:

Year:

2018

Language:

english

File:

PDF, 1.94 MB

english, 2018

18

Key comparison CCEM-K7: AC voltage ratio

Robinson, Ian, Belliss, Janet, Bryant, Stephen, Sánchez, Antonio, Álvarez, Yolanda, Schweiger, Kurt, Díaz, Carlos, Neira, Miguel, Callegaro, Luca, Lee, Rae Duk, Blanc, Isabelle, Overney, Frederic, He,

Journal:

Year:

2012

Language:

english

File:

PDF, 573 KB

english, 2012

19

Synchronization of Sampling-Based Measuring Systesm

Overney, Frederic, Mortara, Alessandro

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2014

Language:

english

File:

PDF, 1.12 MB

english, 2014

20

Restoring the Electrical Properties of CVD Graphene via Physisorption of Molecular Adsorbates

Thodkar, Kishan, Thompson, Damien, Lüönd, Felix, Moser, Lucas, Overney, Frédéric, Marot, Laurent, Schönenberger, Christian, Jeanneret, Blaise, Calame, Michel

Journal:

ACS Applied Materials & Interfaces

Year:

2017

Language:

english

File:

PDF, 1.28 MB

english, 2017

21

ADAM9 expression promotes an aggressive lung adenocarcinoma phenotype

Kossmann, Céline Mongaret, Annereau, Maxime, Thomas-Schoemann, Audrey, Nicco-Overney, Carole, Chéreau, Christiane, Batteux, Frédéric, Alexandre, Jérôme, Lemare, François

Journal:

Year:

2017

Language:

english

File:

PDF, 1.17 MB

english, 2017

22

[IEEE 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Ottawa, ON, Canada (2016.7.10-2016.7.15)] 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Calibration of a LCR-meter at arbitrary phase angles using a fully automated impedance simulator

Overney, Frederic, Jeanneret, Blaise

Year:

2016

Language:

english

File:

PDF, 2.89 MB

english, 2016

23

[IEEE 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012) - Washington, DC, USA (2012.07.1-2012.07.6)] 2012 Conference on Precision electromagnetic Measurements - A high voltage josephson-voltage-standard-locked synthesizer

Jeanneret, Blaise, Overney, Frederic, Rufenacht, A., Mortara, A.

Year:

2012

Language:

english

File:

PDF, 1.83 MB

english, 2012

24

[IEEE 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Paris, France (2018.7.8-2018.7.13)] 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Frequency Dependence Evaluation of CENAM Calculable Resistors

Estrada, Alepth H. Pacheco, Overney, Frederic

Year:

2018

Language:

english

File:

PDF, 212 KB

english, 2018

25

[IEEE 2004 Conference on Precision Electromagnetic Measurements - London, UK (2004.06.27-2004.07.2)] 2004 Conference on Precision Electromagnetic Measurements - NRC-METAS-PTB Collaboration Part 3: Frequency, Current and Field Dependence in the Quantized Hall and Longitudinal Ac Resistance

Overney, Frederic, Wood, Barry, Schurr, Jurgen, Jeanneret, Blaise

Year:

2004

Language:

english

File:

PDF, 396 KB

english, 2004

26

High precision comparison between a programmable and a pulse-driven Josephson voltage standard

Jeanneret, Blaise, Rüfenacht, Alain, Overney, Frédéric, Brom, Helko van den, Houtzager, Ernest

Journal:

Year:

2011

Language:

english

File:

PDF, 169 KB

english, 2011

27

[IEEE 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Ottawa, ON, Canada (2016.7.10-2016.7.15)] 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016) - Characterization of HMDS treated CVD graphene

Thodkar, Kishan, Schonenberger, Christian, Calame, Michel, Luond, Felix, Overney, Frederic, Jeanneret, Blaise

Year:

2016

Language:

english

File:

PDF, 617 KB

english, 2016

28

Inductive voltage divider calibration with sampling method

Corminboeuf, David, Overney, Frédéric, Filtz, J.-R., Larquier, B., Claudel, P., Favreau, J.-O.

Journal:

EPJ Web of Conferences

Year:

2014

Language:

english

File:

PDF, 706 KB

english, 2014

29

The Josephson locked synthesizer

Jeanneret, Blaise, Overney, Frédéric, Rüfenacht, Alain

Journal:

Measurement Science and Technology

Year:

2012

Language:

english

File:

PDF, 285 KB

english, 2012

30

AC Quantum Hall Effect in Epitaxial Graphene

Luond, Felix, Kalmbach, Cay-Christian, Overney, Frederic, Schurr, Jurgen, Jeanneret, Blaise, Muller, Andre, Kruskopf, Mattias, Pierz, Klaus, Ahlers, Franz

Journal:

IEEE Transactions on Instrumentation and Measurement

Year:

2017

Language:

english

File:

PDF, 3.04 MB

english, 2017

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